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The manual typically divides the system into several key components: Running the SmarTest software environment.
A standard test flow in the 93k environment follows a specific hierarchy outlined in the manual:
The 93k uses an equation-based timing system. Instead of hard-coding values, engineers use variables to define cycle times and edge placements, allowing for easy frequency scaling during characterization.
To ensure repeatable results across different testers, the Verigy 93k manual emphasizes strict calibration routines.
Efficiently managing large pattern files is a recurring theme in the manual. It provides instructions on converting third-party formats (like WGL or STIL) into the native 93k binary format. Key Calibration and Maintenance Procedures
The Verigy 93000 (93k) SOC Series remains a cornerstone of Automated Test Equipment (ATE) for high-performance semiconductors. Navigating its extensive documentation is essential for test engineers looking to optimize throughput and maintain signal integrity. This guide provides a strategic overview of the Verigy 93k tester manual, focusing on the SmarTest environment, hardware configurations, and troubleshooting protocols. Understanding the Verigy 93k Architecture
When the tester behaves unexpectedly, the manual suggests a "divide and conquer" approach. First, verify the hardware by swapping a suspected bad PE card with a known good one. Second, use the tool in SmarTest to inspect real-time waveforms. This allows you to see exactly where a timing edge is falling relative to the data window.
💡 Always maintain a "Golden Device." If a test fails across multiple units, run the Golden Device to determine if the issue lies with the tester hardware or the test program itself.
This section explains how to map logical device pins to physical tester channels. It covers the setup of different pin types, such as High-Speed Digital, Analog, or Power Supply pins.
